IEC 60749-23-2004 半导体器件.机械和气候试验方法.第23部分:高温操作寿命

标准号：IEC 60749-23-2004
中文标准名称：半导体器件.机械和气候试验方法.第23部分:高温操作寿命
英文标准名称：Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
标准类型：L40
发布日期：1999/12/31 12:00:00
实施日期：1999/12/31 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
适用范围：This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.