BS EN 60749-23-2004+A1-2011 半导体器件.机械和气候试验方法.高温使用寿命

标准号：BS EN 60749-23-2004+A1-2011
中文标准名称：半导体器件.机械和气候试验方法.高温使用寿命
英文标准名称：Semiconductor devices. Mechanical and climatic test methods. High temperature operating life
标准类型：L40
发布日期：2004/6/24 12:00:00
实施日期：2004/6/24 12:00:00
中国标准分类号：L40
国际标准分类号：31.080.01
引用标准：IEC 60747;IEC 60749-34
适用范围：This test is used to determine the effects of bias conditions and temperature on solid statedevices over time. It simulates the device operating condition in an accelerated way, and isprimarily used for device qualification and reliability monitoring. A form of high temperaturebias life using a short duration, popularly known as “burn-in”, may be used to screen for infantmortality related failures. The detailed use and application of burn-in is outside the scope ofthis standard.